081_New Capabilities of NT-MDT AFM Microscopes: Single-Pass Electrostatic Measurements
Sergei Magonov, NT-MDT Development
Application Note 081
(pdf 3.0 Mb)
082_Single-Pass Measurements in Atomic Force Microscopy: Kelvin Probe Force Microscopy and Local Dielectric Studies
Sergei Magonov, NT-MDT Development Inc. 416 W. Warner Rd. Tempe AZ USA
Application Note 082
(pdf 3.8 Mb)
083_Piezoresponse Force Microscopy in Its Applications
Sergei Magonov, NT-MDT Development
Application Note 083
(pdf 12.4 Mb)
084_Exploring Materials with AFM-based Electrostatic Modes
Sergei Magonov, NT-MDT Development
Application Note 084
(pdf 9.7 Mb)
085_Exploring Nanomechanical Properties of Materials with Atomic Force Microscopy
Sergei Magonov, NT-MDT Development
Application Note 085
(pdf 7.7 Mb)
086_Visualization of Surface Nanostructures and of Morphology
Sergei Magonov, NT-MDT Development
Application Note 086
(pdf 6.0 Mb)
087_Expanding Atomic Force Microscopy with HybriD Mode Imaging
Sergei Magonov, NT-MDT Development Inc.
Application Note 087
(pdf 9.0 Mb)
088_High-Resolution Imaging in Different Atomic Force Microscopy Modes
John Alexander and Sergei Magonov NT-MDT Development Inc. Tempe AZ USA
Application Note 088
(pdf 2.7 Mb)
089_Characterization of Materials with a Combined AFM/Raman Microscope
Marko Surtchev, Sergei Magonov and Mark Wall
Application Note 089
(pdf 3.3 Mb)
090_Quantitative Nanomechanical Measurements in HybriDTM Mode Atomic Force Microscopy
Sergei Magonov, Marko Surtchev, Sergey Belikov, Ivan Malovichko and Stanislav Leesment
Application Note 090
(pdf 2.7 Mb)
091_Solar Cell Diagnostics by Combination of Kelvin Probe Force Microscopy with Local Photoexitation
A.V.Ankudinov Ioffe Physical-Technical Institute of the Russian Academy of Science National Research University of Information Technologies, Mechanics and Optics
Application Note 091
(pdf 2.6 Mb)
092_AFM-Raman Characterization of Pharmaceutical Tablets
Sergey Shashkov and Pavel Dorozhkin
Application Note 092
(pdf 2.9 Mb)
093_AFM – Raman Characterization of Li-ion Batteries
Sergey Shashkov and Pavel Dorozhkin
Application Note 093
(pdf 3.3 Mb)
094_Interplay between Raman Scattering and Atomic Force Microscopy in Characterization of Polymer Blends
P.Dorozhkin, A.Shelaeol and S.Magonov
Application Note 094
(pdf 3.2 Mb)
095_Exploring Imaging in Oscillatory Resonance AFM Modes: Backgrounds and Applications
Sergei Magonov, Sergey Belikov, John Alexander and Marko Surtchev NT-MDT Development Inc, Tempe AZ, USA
Application Note 095
(pdf 5.0 Mb)