DRP30_SS
€1.485,00
Unique Super Sharp probes with single crystal diamond tip for topography measurements.
The probes are highly resistant to mechanical destructions and keep their sharpness during the whole working day and more!
These probes enable highly repeatable high resolution operation to ensure you consistently get the best possible data from your system.
Nominal values: force constant - 40 N/m, resonance frequency – 180 kHz.
Upon customers' request the next options are available:
- - super sharp probes with typical curvature radius 2nm;
- - probes with another lever specification;
- - probes with individually characterized spring constant and tip radius to enable fully quantitative nanomechanical measurements.
Cantilever specifications
| Geometry: | Rectangular |
| Material: | Diamond coated Si |
| Cantilever bending: | < 3° |
Bulk tip specifications
| Si geometry: | Rotated (Symmetric) |
| Si tip height (h): | 15 ± 2 μm |
| Front angle: | 25 ± 2° |
| Back angle: | 22 ± 2° |
| Side angle: | 18 ± 2° |
| Tip offset: | 10 – 20 μm |
Single crystal diamond tip specifications
| Geometry: | Cone |
| Tip radius: | Typical 2nm, guaranteed <5nm |
| Tip height (h): | 300 nm ± 100 nm |
| Tilt angle: | 0 ± 1° |
| Tip material: | Single crystal diamond |
| Cone ½ angle: | 15 ± 2° |
General Features
| Chip size | 3.4×1.6×0.3 |
| Reflective side coating | Au |
| Tip coating | Single crystal diamond |
| Tip curvature radius | typical 2nm, guaranteed <5nm |
Special Features
Cantilever series |
Cantilever length, L±10µm |
Cantilever width, W±5µm |
Cantilever thickness, T±1.0µm |
Resonant frequency, kHz |
Force constant, N/m |
||||
|---|---|---|---|---|---|---|---|---|---|
min |
typical |
max |
min |
typical |
max |
||||
DPR30_SS |
225 |
28 |
3.0 |
140 |
180 |
220 |
20 |
40 |
60 |
Additional information
| Quantity |
|---|
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