TGZ1
€170,00
Calibration grating TGZ1 for Z-axis calibration (step height 20,0±1.5nm) and nonlinearity measurements.
Step height is the average meaning based on the measurements of 5 gratings with the same height (from the batch of 300 gratings) by AFM calibrated wih help of PTB certified grating TGZ1. Basic step height can vary from the specified one within ±10 % depending on the batch (for example TGZ1 grating can have step height 22±1.5 nm).
General Features
| Structure | step – SiO2, bottom – Si |
| Pattern type | 2-Dimensional |
| Period | 3±0,05 µm |
| Height | 20,0±1.5 nm* |
| Chip size | 5x5x0,5 mm |
| Effective area | central square 3×3 mm |
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