TGX1
€250,00
Calibration grating TGX1 is intended for
- lateral calibration of AFM scanners
- detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects;
- determination of the tip sharpness.
General Features
| Structure | Si |
| Pattern type | chessboard-like array of square pillars with sharp undercut edges |
| Period | 3±0,05 µm |
| Height | ~ 0,6 µm |
| Chip size | 5x5x0,5 mm |
| Effective area | central square 3×3 mm |
| Edge curvature radius | less then 10nm |
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