CSC05
€400,00
Whisker Type High Aspect Ration Silicon AFM Cantilevers CSC05 series for Contact applications. Typical Resonant Frequency 22 kHz (guaranteed range 8-39kHz), Typical Force Constant 0.11 N/m (guaranteed range 0.01-0.5N/m). Cantilever has Au reflective side coating to increase laser signal.
Whisker probe is an indispensable instrument for studying surfaces of unusual profile with narrow gaps. Standard cantilevers fail to investigate such objects with the necessary precision.Whisker probes differ from any standard ones by having long slim "whisker" at the very end of the tip. It is possible “whisker” to be grown at any angle to the silicon tip axis for being perpendicular to the investigated surface.
As standard product we offer two variants of inclination angle - 10 and 20 degrees. At customer's request any angle can be grown.
Probes are packed in boxes with 5 pieces.
General Features
| Whisker Material | Carbon Modification |
| Aspect Ratio | 10:1 |
| Whisker length | 0.4±0.2 µm |
| Material | Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped |
| Chip size | 3.4×1.6×0.3mm |
| Reflective side coating | Au |
| Tip coating | No |
| Tip curvature radius | < 10nm |
Special Features
Cantilever series |
Cantilever length, L±10µm |
Cantilever width, W±5µm |
Cantilever thickness, T±0.5µm |
Resonant frequency, kHz |
Force constant, N/m |
||||
|---|---|---|---|---|---|---|---|---|---|
min |
typical |
max |
min |
typical |
max |
||||
CSC05 |
225 |
30 |
1.0 |
8 |
22 |
39 |
0.01 |
0.11 |
0.5 |
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