DEP01

900,00

Unique probes with single crystal diamond tip for topography and electrical measurements. Nominal values: force constant - 2.8 N/m, resonance frequency – 75 kHz. Highly Conductive Long Lasting Sharp Diamond Probes formed by a unique patented process ensure the best possible wear and electrical performance. The tips are sharper and last longer than any other electrical AFM probe. The probes are highly resistant to mechanical destructions and keep their sharpness during the whole working day and more!
These probes enable highly repeatable high resolution operation to ensure you consistently get the best possible data from your system. The conductive diamond coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 - 0.005 Ohm•cm. A sharp tip is formed from a single diamond crystal which yields an unsurpassed combination of resolution, mechanical properties and electrical performance. Contact resistance is between 10k and 100k ohms depending on contact radius measured on a silver coated surface. A gold reflex coating is deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.
Upon customers' request the next options are available:
  • - super sharp probes with typical curvature radius 2nm;
  • - probes with another lever specification;
  • - probes with individually characterized spring constant and tip radius to enable fully quantitative nanomechanical measurements.

Cantilever specifications

   Geometry:    Rectangular
   Material:   Diamond coated Si
  Cantilever bending:     < 3°

Bulk tip specifications

   Si geometry:    Rotated (Symmetric)
   Si tip height (h):          15 ± 2 μm
   Front angle:    25 ± 2°
   Back angle:    22 ± 2°
   Side angle:    18 ± 2°
   Tip offset:    10 – 20 μm

Single crystal diamond tip specifications

   Geometry:    Cone
   Tip radius:   Typical 7nm, guaranteed <10nm
   Tip height (h):          300 nm ± 100 nm
   Tilt angle:    0 ± 1°
   Tip material:      Single crystal diamond
Highly doped with boron
   Cone ½ angle:    15 ± 2°

General Features

Chip size 3.4×1.6×0.3
Reflective side coating Au
Tip coating Single crystal diamond, Highly doped with boron
Tip curvature radius typical 7nm, guaranteed <10nm

Special Features

Cantilever series
Cantilever length, L±10µm
Cantilever width, W±5µm
Cantilever thickness, T±0.5µm
Resonant frequency, kHz
Force constant, N/m
min
typical
max
min
typical
max
DEP01
225
35
1.5
50
65
100
1.2
2.8
4.5

Additional information

Quantity

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