DEP30
€810,00
Unique probes with single crystal diamond tip for topography and electrical measurements. Nominal values: force constant - 40 N/m, resonance frequency – 180 kHz.
Highly Conductive Long Lasting Sharp Diamond Probes formed by a unique patented process ensure the best possible wear and electrical performance. The tips are sharper and last longer than any other electrical AFM probe.
The probes are highly resistant to mechanical destructions and keep their sharpness during the whole working day and more!
These probes enable highly repeatable high resolution operation to ensure you consistently get the best possible data from your system.
The conductive diamond coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 - 0.005 Ohm•cm. A sharp tip is formed from a single diamond crystal which yields an unsurpassed combination of resolution, mechanical properties and electrical performance. Contact resistance is between 10k and 100k ohms depending on contact radius measured on a silver coated surface. A gold reflex coating is deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.
Upon customers' request the next options are available:
- - super sharp probes with typical curvature radius 2nm;
- - probes with another lever specification;
- - probes with individually characterized spring constant and tip radius to enable fully quantitative nanomechanical measurements.
Cantilever specifications
| Geometry: | Rectangular |
| Material: | Diamond coated Si |
| Cantilever bending: | < 3° |
Bulk tip specifications
| Si geometry: | Rotated (Symmetric) |
| Si tip height (h): | 15 ± 2 μm |
| Front angle: | 25 ± 2° |
| Back angle: | 22 ± 2° |
| Side angle: | 18 ± 2° |
| Tip offset: | 10 – 20 μm |
Single crystal diamond tip specifications
| Geometry: | Cone |
| Tip radius: | Typical 7nm, guaranteed <10nm |
| Tip height (h): | 300 nm ± 100 nm |
| Tilt angle: | 0 ± 1° |
| Tip material: | Single crystal diamond Highly doped with boron |
| Cone ½ angle: | 15 ± 2° |
General Features
| Chip size | 3.4×1.6×0.3 |
| Reflective side coating | Au |
| Tip coating | Single crystal diamond, Highly doped with boron |
| Tip curvature radius | typical 7nm, guaranteed <10nm |
Special Features
Cantilever series |
Cantilever length, L±10µm |
Cantilever width, W±5µm |
Cantilever thickness, T±0.5µm |
Resonant frequency, kHz |
Force constant, N/m |
||||
|---|---|---|---|---|---|---|---|---|---|
min |
typical |
max |
min |
typical |
max |
||||
DEP30 |
225 |
28 |
3.0 |
140 |
180 |
220 |
20 |
40 |
60 |
Additional information
| Quantity |
|---|
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