DRP30_SS

DRP30_SS

1.350,00

Unique Super Sharp probes with single crystal diamond tip for topography measurements. The probes are highly resistant to mechanical destructions and keep their sharpness during the whole working day and more! These probes enable highly repeatable high resolution operation to ensure you consistently get the best possible data from your system. Nominal values: force constant - 40 N/m, resonance frequency – 180 kHz. Upon customers' request the next options are available:
  • - super sharp probes with typical curvature radius 2nm;
  • - probes with another lever specification;
  • - probes with individually characterized spring constant and tip radius to enable fully quantitative nanomechanical measurements.

Cantilever specifications

   Geometry:    Rectangular
   Material:   Diamond coated Si
  Cantilever bending:     < 3°

Bulk tip specifications

   Si geometry:    Rotated (Symmetric)
   Si tip height (h):          15 ± 2 μm
   Front angle:    25 ± 2°
   Back angle:    22 ± 2°
   Side angle:    18 ± 2°
   Tip offset:    10 – 20 μm

Single crystal diamond tip specifications

   Geometry:    Cone
   Tip radius:   Typical 2nm, guaranteed <5nm
    Tip height (h):          300 nm ± 100 nm
   Tilt angle:    0 ± 1°
   Tip material:    Single crystal diamond
   Cone ½ angle:    15 ± 2°

General Features

Chip size 3.4×1.6×0.3
Reflective side coating Au
Tip coating Single crystal diamond
Tip curvature radius typical 2nm, guaranteed <5nm

Special Features

Cantilever series
Cantilever length, L±10µm
Cantilever width, W±5µm
Cantilever thickness, T±1.0µm
Resonant frequency, kHz
Force constant, N/m
min
typical
max
min
typical
max
DPR30_SS
225
28
3.0
140
180
220
20
40
60

Additional information

Quantity

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