DRPS_In

Unique probes with Single Crystal Diamond tip specially designed for Nanoindentation, Nanoscratching, Lithography etc. Resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 10nm.

These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a board cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and are able to image the indents at high resolution in-situ using the same probe. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.

The probes come with individual high resolution SEM image and ideally suited to scratch testing and long period probe lifetime applications where quantitative nanomechanics are not essential.

Nominal values: force constant - 350 N/m, resonance frequency – 750 kHz. Upon customers' request the next options of single crystal probes are available: - probes with individually characterized spring constant and tip radius to enable fully quantitative nanomechanical measurements.