DRPS_In

1.350,00

Unique probes with Single Crystal Diamond tip specially designed for Nanoindentation, Nanoscratching, Lithography etc. Resonant frequency 500-1000kHz, force constant 100-600 N/m, typical curvature radius 10nm.

These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a board cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and are able to image the indents at high resolution in-situ using the same probe. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.

The probes come with individual high resolution SEM image and ideally suited to scratch testing and long period probe lifetime applications where quantitative nanomechanics are not essential.

Nominal values: force constant - 350 N/m, resonance frequency – 750 kHz. Upon customers' request the next options of single crystal probes are available: - probes with individually characterized spring constant and tip radius to enable fully quantitative nanomechanical measurements.

Cantilever specifications

   Geometry:    Rectangular
   Material:   Diamond coated Si
   Cantilever bending:    < 3°

Bulk tip specifications

   Si geometry:     4 Sided Pyramid
   Si tip height (h):          12,5 ± 2.5 μm
   Front angle:    25 ± 5°
   Back angle:    15 ± 5°
   Side angle:    22.5 ± 5°
   Tip offset:    15 ± 5 μm

Single crystal diamond tip specifications

   Geometry:    Cone
   Tip radius:   10 ± 5 nm
   Tip height (h):          500 nm ± 100 nm
   Tilt angle:    0 ± 1°
   Tip material:    Diamond
   Cone ½ angle:    45 ± 3°

General Features

Chip size 3.4×1.6×0.3
Reflective side coating Au
Tip coating Single crystal diamond
Tip curvature radius typical 10nm, guaranteed <15nm

Special Features

Cantilever series
Cantilever length, L±10µm
Cantilever width, W±5µm
Cantilever thickness, T±0.5µm
Resonant frequency, kHz
Force constant, N/m
min
typical
max
min
typical
max
DPRS_In
125
30
4.0
500
750
1000
100
350
600

Additional information

Quantity

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