FMG01_SS
€750,00
Super Sharp High Resolution Silicon AFM Cantilevers FMG01_SS series are designed for Force Modulation applications. Typical Resonant Frequency 60 kHz (guaranteed range 40-96kHz), Typical Force Constant 3 N/m (guaranteed range 1-5N/m). Typical tip curvature radius is 2nm.
Using the probes with sharpened tips you will be able to increase resolution of the obtained images especially on objects with typical sizes of several nanometers.Cantilever has Al reflective side coating to increase laser signal.
Probes are packed in boxes with 5 pieces.
Cantilever has Au reflective side coating to increase laser signal.
General Features
| Material | Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped |
| Chip size | 3.4×1.6×0.3mm |
| Reflective side coating | Al |
| Tip coating | No |
| Tip curvature radius | typical 2nm, guaranteed 5nm |
Special Features
Cantilever series |
Cantilever length, L±10µm |
Cantilever width, W±5µm |
Cantilever thickness, T±0.5µm |
Resonant frequency, kHz |
Force constant, N/m |
||||
|---|---|---|---|---|---|---|---|---|---|
min |
typical |
max |
min |
typical |
max |
||||
FMG01_SS |
225 |
32 |
2.5 |
40 |
60 |
96 |
1 |
3 |
5 |
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