HA_CNC/Pt

HA_CNC/Pt

300,00820,00

High Resolution High Accuracy AFM Cantilevers HA_CNC/Pt series are designed for Semicontact ( Intermittent ), Noncontact and electrical applications (SKM, SCM, SRIM, EFM, LAO Lithography). Each probe has 2 rectangular cantilevers.Typical Resonant Frequency 66kHz / 46kHz (dispersion ±10%). Typical Force Constant 1.5N/m / 1.0N/m (dispersion ±20%). Cantilever has Au reflective and Pt tip side coatings. Probes are also available without tip coating. Probes are packed in boxes with 15 and 50 pieces. Amount discount is included in the package price.
High Accuracy composite ETALON probes combine the main features allowing to obtain high quality AFM images:
  • Sharp tip - curvature radius < 10 nm.
  • Resonance frequency, specified with high accuracy - ±10% within a wafer.
  • Special chip geometry with vertical sidewalls for convenient operating.
  • High aspect ratio tip.
  • Enhanced back-side reflection of the cantilever.
  • Cost effective price.
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General Features

Material Polysilicon cantilever, silicon tip
Chip size 3.6×1.6×0.4mm
Reflective side coating Au
Tip coating Pt
Tip curvature radius < 35nm
Available tip coatings Au

Special Features

Cantilever series
Cantilever
Cantilever length, L±2µm
Cantilever width, W±3µm
Cantilever thickness, T±0.15µm
Resonant frequency, kHz
Force constant, N/m
min
typical
max
min
typical
max
HA_CNC/Pt
A
184
34
1.85
59
66
75
1.2
1.5
1.8
B
224
34
1.85
41
46
51
0.8
1.0
1.2

Additional information

Quantity

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