HA_NC/FD
€800,00
The best AFM tips for routine measurements at the reasonable price!
Unique probes with Single Crystal Full Diamond tip for topography measurements.
Nominal values: force constant - 3.5 N/m, resonance frequency – 140 kHz.
Probe highlights:
- The probes are highly resistant to mechanical destructions and keep their sharpness during the whole working day and more!
- These probes enable highly repeatable high resolution operation to ensure you consistently get the best possible data from your system.
- Diamond tips are less sensitive to static charges on sample’s surface. That results in easy approach and more detailed topography imaging in comparison with Si cantilevers in the same conditions.
- Due to the hydrophobic surface the diamond tip doesn’t get dirty while scanning samples (biological etc.).
Diamond tip specifications
|
Geometry: |
Cone |
|
Tip radius: |
< 10nm |
|
Tip height (h): |
10-15 µm |
|
Tip material: |
Single crystal diamond |
|
Cone angle: |
< 25° |
General Features
| Material | Polysilicon cantilever, full diamond tip |
| Chip size | 3.6×1.6×0.4mm |
| Reflective side coating | Au |
| Tip coating | No |
| Tip curvature radius | < 10nm |
Special Features
Cantilever series |
Cantilever length, L±2µm |
Cantilever width, W±3µm |
Cantilever thickness, T±0.15µm |
Resonant frequency, kHz |
Force constant, N/m |
||||
|---|---|---|---|---|---|---|---|---|---|
min |
typical |
max |
min |
typical |
max |
||||
HA_NC/FD |
124 |
34 |
1.85 |
125 |
140 |
155 |
2.5 |
3.5 |
4.5 |
Additional information
| Quantity |
|---|
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