HA_NC/FD

HA_NC/FD

800,00

The best AFM tips for routine measurements at the reasonable price! Unique probes with Single Crystal Full Diamond tip for topography measurements. Nominal values: force constant - 3.5 N/m, resonance frequency – 140 kHz.

Probe highlights:

  • The probes are highly resistant to mechanical destructions and keep their sharpness during the whole working day and more!
  • These probes enable highly repeatable high resolution operation to ensure you consistently get the best possible data from your system.
  • Diamond tips are less sensitive to static charges on sample’s surface. That results in easy approach and more detailed topography imaging in comparison with Si cantilevers in the same conditions.
  • Due to the hydrophobic surface the diamond tip doesn’t get dirty while scanning samples (biological etc.).

Diamond tip specifications

Geometry:

Cone

Tip radius:

  < 10nm

       Tip height (h):

10-15 µm

Tip material:

 Single crystal diamond

Cone angle:

< 25°

General Features

Material Polysilicon cantilever, full diamond tip
Chip size 3.6×1.6×0.4mm
Reflective side coating Au
Tip coating No
Tip curvature radius < 10nm

Special Features

Cantilever series
Cantilever length, L±2µm
Cantilever width, W±3µm
Cantilever thickness, T±0.15µm
Resonant frequency, kHz
Force constant, N/m
min
typical
max
min
typical
max
HA_NC/FD
124
34
1.85
125
140
155
2.5
3.5
4.5

Additional information

Quantity

,

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