MFM01
€690,00
High Resolution Silicon AFM Cantilevers MFM01 series.are specially designed for work in magnetic AFM mode (MFM).
Due to optimized coating thickness these probes suit for different magnetic samples and are recommended for initial measurements of new samples. Upon reviewing the results you can take a decision if the MFM coating used is the appropriate one or it is better to try another type of magnetic coating.
Due to special defensive layers which prevent the ferromagnetic tip coating from oxidizing, all MFM probes have a long shelf life, and the small tip curvature radius enables you to obtain good high resolution images.Typical Resonant Frequency of the probes 70 kHz (guaranteed range 47-90kHz), typical Force Constant 3N/m (guaranteed range 1-5N/m). Cantilever has Al reflective side coating to increase laser signal.
Probes are packed in boxes with 15 pieces
General Features
| Material | Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped |
| Chip size | 3.4×1.6×0.3mm |
| Reflective side coating | Al |
| Tip coating | CoCr |
| Tip curvature radius | ~ 40nm |
Special Features
Cantilever series |
Cantilever length, L±5µm |
Cantilever width, W±5µm |
Cantilever thickness, T±0.5µm |
Resonant frequency, kHz |
Force constant, N/m |
||||
|---|---|---|---|---|---|---|---|---|---|
min |
typical |
max |
min |
typical |
max |
||||
MFM01 |
225 |
28 |
3.0 |
47 |
70 |
90 |
1 |
3 |
5 |
Additional information
| Quantity |
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