NSG30_SS
€750,00
Super Sharp High Resolution Silicon AFM Cantilevers NSG30_SS series are designed for Semicontact ( Intermittent ), Noncontact applications. Typical Resonant Frequency 320 kHz (guaranteed range 240-440 kHz), Typical Force Constant 40 N/m (guaranteed range 22-100 N/m). Typical tip curvature radius is 2nm.
Using the probes with sharpened tips you will be able to increase resolution of the obtained images especially on objects with typical sizes of several nanometers.Cantilever has Al reflective side coating to increase laser signal.
Probes are packed in boxes with 5 pieces.
General Features
| Material | Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped |
| Chip size | 3.4×1.6×0.3mm |
| Reflective side coating | Al |
| Tip coating | No |
| Tip curvature radius | typical 2nm, guaranteed 5nm |
Special Features
Cantilever series |
Cantilever length, L±10µm |
Cantilever width, W±7.5µm |
Cantilever thickness, T±1µm |
Resonant frequency, kHz |
Force constant, N/m |
||||
|---|---|---|---|---|---|---|---|---|---|
min |
typical |
max |
min |
typical |
max |
||||
NSG30_SS |
125 |
30 |
4.0 |
240 |
320 |
440 |
22 |
40 |
100 |
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