TDG01
€300,00
Calibration grating TDG01 is intended for AFM submicron calibration in X or Y direction. Period is 278nm.
General Features
| Structure | the grating is formed on the chalcogenide glass coated by Al |
| Pattern type | parallel ridges in X or Y direction, 1-Dimensional |
| Period | 278 ± 1 nm |
| Height | > 55 nm |
| Chip size | diameter 12,5 mm, thickness – 2,5 mm |
| Effective area | central diameter 9 mm |
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