VIT_P/IR

VIT_P/IR

650,001.650,00

TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P/IR series are specially designed for tip or laser spot precise positioning over the point of interest. Typical Resonant Frequency 300 kHz (guaranteed range 200-490 kHz), Typical Force Constant 50 N/m (guaranteed range 25-95 N/m). Cantilevers have Au reflective coating. Probes are also available with no coating as well as with conductive tip coating. Probes are packed in boxes with 15 and 50 pieces. Amount discount is included in the package price.
Clear

General Features

Material Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size 3.4×1.6×0.3mm
Reflective side coating Au
Tip coating No
Tip curvature radius typical 6nm, guaranteed 10nm
Available tip coatings Pt, Au

Special Features

Cantilever series
Cantilever length, L±10µm
Cantilever width, W±5µm
Cantilever thickness, T±1µm
Resonant frequency, kHz
Force constant, N/m
min
typical
max
min
typical
max
VIT_P/IR
160
45
5.0
200
300
490
25
50
95

Additional information

Quantity

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