VIT_P_C/TERS

TERS probes based on AFM Top Visual cantilevers provide TERS (and AFM) performance in Contact Mode.

The probes provide guaranteed TERS performance on a test sample (organic molecules on Au substrate): - Enhancement factor >50x (Tip IN vs. Tip. OUT) for ~70% of probes. Typical enhancement factor : > 100x. Some probes reach >500x enhancement. - TERS (nano-Raman mapping). ~20-70 nm resolution. >50% of probes. - Remarkable lifetime without considerable enhancement degradation The specified parameters are guaranteed only on the TERS sample – TERS_S. Cantilevers  lifetime is 3 months. Probes are guaranteed to work on the NT-MDT AFM-Raman system with the following system requirements: (i) Confocal Raman microscope (OMUxxx series), 633 nm gas laser (LM633 series), Optical AFM head (SNAxxx series), Laser scanning module (SIO01) with corresponding controller. If this requirement is not fulfilled, TERS probes can only be supplied without any performance guaranty – “as is”. Probes can be supplied for equipment from other manufacturers without any perfomance guarantee. TERS probes based on AFM Top Visual cantilevers provide TERS (and AFM) performance in Contact Mode, no reflective coating,  resonant frequency 8-25 kHz, force constant 0.06-1 N/m. TOP VISUAL High Resolution Contact Silicon AFM Cantilevers VIT_P_C-A series are specially designed for tip or laser spot precise positioning over the point of interest. Typical Resonant Frequency 16 kHz (guaranteed range 8-25 kHz), Typical Force Constant 0.3 N/m (guaranteed range 0.06-1N/m). Cantilevers have Al reflective coating. Probes are packed in boxes with 10 pieces.