We would like to present you our new products – Unique probes with single crystal diamond tip for topography and electrical measurements. The probes that keep their sharpness during the whole working day and more!
Using the probes you don’t need to choose between performance, lifetime and price anymore. Diamond manufacturing technology provides both sharp and wear-resistant, high quality AFM probes at a realistic price.
The main probe advantages:
High Resolution Diamond Tip – typical tip radius 7nm for both topography and electrical measurements.
Endurance of Diamond – at least 10x Lifetime of Silicon.
Standard AFM chip size.
Sharp, single crystal diamond AFM probes give the AFM user all the known resilience benefits of hard diamond, with no compromise on image resolution.
